Materials Characterization and Final Test Facility
An essential element in developing improved products and maintaining the quality of our production is our extensive material characterization and final test facility. Masimo Semiconductor has extensive in-house instrumentation and test equipment.
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In-House Instrumentation
Double crystal x-ray diffraction
• Layer thickness
• Composition
• Composition
Polaron and Hall carrier concentration
Automated on-wafer device test
Photoluminescence & reflectivity mapping
• Spectral response
• Quantum efficiency
• VCSEL maps
• Quantum efficiency
• VCSEL maps
Normarski microscopy
Surfscan defect and haze data
Device Test
- Quantum Efficiency Measurements
- Automated Wafer Testers (PIV and Spectrum of LEDs, VCSELs, PD dark current)
- Solar Simulator (illuminated IV tests of photovoltaics and LPCs)
- Flash Solar Simulator (concentration to 1000 suns for solar cells)
View a list of available brochures and request additional information.
